Statistical Methods for Industrial Process Control

Subtitle:
Practical Methods for Industrial Applications
Author:
David Drain
Format:
Hardcover

Now:R2,451.95
eBucks:eB24520

United States of America

Delivery:
Usually within 16 working days.
Seller:
kalahari.com

Statistical Methods for Industrial Process Control

Short description

This combined text and reference is the second in the "Solid State Science and Engineering" series and is designed to teach semiconductor engineers to apply sophisticated statistical methods to problems of semiconductor manufacture and fabrication.

Long description

This combined text and reference is the second in the VNR "Solid State Science and Engineering" series and is designed to teach semiconductor engineers to apply sophisticated statistical methods to problems of semiconductor manufacture and fabrication. These statistical methods are not taught in most undergraduate engineering programs and current books are difficult to comprehend and to apply. This book teaches statistical tools in a manner engineers will find easy to learn and use; it specifically applies these methods to the semiconductor fabrication process.

Product details

Publisher:
Springer
ISBN:
9780412085116
Publication date:
January 1997
Length:
236mm
Width:
161mm
Thickness:
29mm
Weight:
771g
Pages:
476
Illustrations:
60line drawings
Readership:
Tertiary education; Professional & scholarly

Table of contents

  • Basic Probability and Statistics Introduction Probability Sampling Estimati on Hypothesis Testing Summary Linear Regression Analysis Introduction Linear Regression Analysis Interpreting Results Applying Simple Linear Regression Polynomial and Multiple Regression Summary Variance Components and Process Sampling Design Introduction Variance Structures Estimating Nested Variance Components Process Sampling Design Summary Measurement Capability Introduction The Costs of Flawed Measurement Measurement Capability Defined Assessing and Improving Measurement Capability Purchasing and Qualifying Equipment Overcoming Difficult Measurement Problems Summary Introduction to Statistical Process Control Introduction Fundamental Principles of SPC Essential Components of SPC Example Process Control System Benefits and Costs of SPC Statistical Process Control Implementation Introduction Select Key Process Parameters Design a Data Collection System and Collect D ata Select Summary Measures and Control Charts Assess Process stability and Capability Develop the Five Working Parts Maintain and Improve the System Disposition Limits Summary Technical Notes Answers to Problems References SAS Appendix

Other products to consider

0000: Statistics: A Bayesian Perspective
0000: Statistics: A Bayesian Perspective

Author:
Donald A. Berry
Was R1,132.95
Now R951.95
(eB 9520)
Super Reviews; All You Need to Know: Statistics
Super Reviews; All You Need to Know: Statistics

Author:
Research & Education Association
Now R89.95
(eB 900)
Applied Multivariate Statistical Analysis
Applied Multivariate Statistical Analysis

Author:
Dean W. Wichern; Richard A. Johnson
Now R2,599.95
(eB 26000)
Statistics: An Introduction Using R
Statistics: An Introduction Using R

Author:
Michael J. Crawley
Was R429.95
Now R361.95
(eB 3620)

Customer reviews & ratings

Buy this product

Statistical Methods for Industrial Process Control

Statistical Methods for Industrial Process Control

Now:R2,451.95
eBucks:eB24520
The basket has moved
 
Free delivery on orders over R250 *
 
My wishlists
Your wishlist is empty
Earn with Visa Premium
 
eBucks
 
RSS
Books you might find useful
1.
Dis ek, Anna
Now R153.95
(eB 1540)

2.
3.
Economics for South African students
Was R399.95
Now R335.95
(eB 3360)

4.
Managerial finance
Was R391.95
Now R329.95
(eB 3300)

5.
Constructing a good dissertation
Now R248.95
(eB 2490)

6.
Discover History
Now R190.95
(eB 1910)

7.
A student's A-Z of psychology
Now R144.95
(eB 1450)

8.
Operations management
Was R391.95
Now R329.95
(eB 3300)

9.
10.
HAT 5
Out of stock

m.kalahari.com
 
Become a corporate client with kalahari.com
 
Book donation project